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Custom
Optical
Sensors and Inspection Systems |
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| How
can I measure surface finish (roughness)? |
| How
can I measure surface color? |
| How
can I detect cracks, flaws, and imperfections? |
| How
can I do dimensional checks? |
| How
can I detect vibration? |
| How
can I monitor concentration and composition of liquids
or gels? |
| Can
a single system handle multiple sensors? |
| How
will a Lightway's system integrate into my existing
control protocol? |
| Can
I see a summary of optical inspection applications? |
| What are the main roughness parameters? |
| What are the "land mines" in the optical dimensional measurements? |
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| How
can I measure surface finish (roughness)? |
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Optically, surface roughness can be measured in both
relative and absolute units of measurement, but only in
its statistical form - Ra.
Relative
measurements produce results proportional to the
variance of the surface finish of the actual process
components. Translation from relative to absolute units
is possible via calibration of the sensor's output
against a "reference standard". These
measurements are convenient in a moving-process,
unmanned checks because of its moderate cost and
relative immunity to the position of the surface under
measurement.
Measuring
roughness in absolute units such as microns or
microinches is also possible, but requires a precision
sensor with an associated cost premium. Such sensors are
used in industries where the complexity and cost of the
measurement equipment is compensated for by the results
achieved, e.g. semiconductor or hard disk drive
manufacturing.
The
optical methods has several key advantages: (a) areas
can be measured in situations where mechanical styluses
cannot access, (b) sensitivity of the method is much
higher than that of stylus tips, (c) non-contact, hence,
non-destructive and clean.
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| How
can I measure surface color? |
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of Page |
Surface color measurement is the area of photometry
where everything is related to the response of human eye
to the spectral distribution of light. Numerically, a
color can be described in a "color space" - a
set of functions with 3 parameters. To accommodate
various existing industrial equipment working with
colors, different types of color spaces have been
developed - RGB, Lab, CMYK, HSB, XYZ, etc. Any color can
be translated between various color spaces.
The
sensor / light source arrangement is critical to
performance; Lightway Systems will provide the expertise
to ensure a successful application.
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| How
can I detect cracks, flaws, and imperfections? |
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of Page |
This is an ideal application for using a polarized
light. Even tiny micron-size surface imperfections will
distort the expected polarization state of the reflected
light. A sensor camera will capture the distortions and
show them vividly.
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| How
can I do dimensional checks? |
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of Page |
Machine vision is the convenient answer to the problem.
Typically for industry, the practical (and sometimes
theoretical) limit of sizes handled by vision-based
systems is 2-3 microns. System components must be
selected according to the required performance
parameters such as; processing speed, surface area,
image size, etc. Once again, the expertise of
application will ensure the right components for the
right task.
Measuring
sizes comparable or below the wavelength of light can be
conducted reliable with interference methods. This
raises the bar of standards for material handling,
optical precision, and the final cost.
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| How
can I detect vibration? |
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of Page |
A slightest vibration can be easily detected utilizing
an optical fiber / sensor arrangement. When stressed, a
twisted optical fiber modulates the intensity of light
passing through it; a sensor is positioned to detect and
measure the degree of vibration.
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| How
can I monitor concentration and composition of liquids
or gels? |
Top
of Page |
Using a sensor designed to measure the refractive index
either on-line or via samples both concentration and/or
composition can be monitored.
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| Can
a single system handle multiple sensors? |
Top
of Page |
A single industrial computer with Lightway's sensor
interface board(s) can simultaneously handle the output
from multiple sensors, for either separate process
control or consensus decision making. Multiple sensors
can be used for redundancy or logic applications.
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How
will a Lightway system integrate into my existing
control protocol?
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Top
of Page |
Protocol compatibility is achieved through the use of
commercially available interface cards. Thereby ensuring
a seamless integration into any existing architecture.
Can I see a summary of optical inspection applications?
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Can
I see a summary of optical inspection applications? |
Top
of Page |
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| CATEGORY |
PROBLEMS
TO SOLVE |
| Image
Analysis |
Part
Recognition / Sorting
Presence / Absence
Surface pattern statistics
Dimensional Measurements
Texture analysis |
| Surface
Properties Analysis |
Color
characteristics
Finishing (roughness)
"Skin layer" uniformity
Presence / Condition of coatings
Surface profile statistics |
| Material
Properties Analysis |
Refractive
index
Optical constants
Stress
Mixture composition / uniformity
Thickness |
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| PROPERTY
OF LIGHT |
WHAT
TO INSPECT BASED ON ... |
| TRANSMISSION |
REFLECTION |
AMBIENT
RECEPTION |
| Intensity |
Optical
Density
Absorption
Thickness |
Distance
Roughness
Temperature |
Intensity
Pollution
Temperature |
Spectral
Characteristics |
Color
Pollution
Material Properties |
Color
Temperature
Humidity
Material Properties |
Light
Sources
Pollution
Flame Detection
Temperature |
| Polarization
State |
Stress |
Material
Properties
Thin Film Thickness |
Pollution |
| Spatial
Distribution (image, specularities) |
Pattern
Dimensions
Texture
Flaws |
Pattern
Dimensions
Texture
Surface Profile
Flaws
Roughness |
Dimensions
Distance |
| Coherence |
Thickness
Distance |
Distance |
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| What are the main roughness parameters? |
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of Page |
1. Rq - Root Mean Square Roughness
2. Ra - Average Roughness
3. Rz - Average Maximum Height of the Profile
4. Rp - Maximum Profile Peak Height
5. Rv - Maximum Profile Valley Depth
6. S - Mean Spacing of Local Peaks of the Profile
7. Sm - Mean Spacing of Profile Irregularities
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| What are the "land mines" in the optical dimensional measurements? |
Top
of Page |
The main limitations are:
1. Range-to-resolution ratio: Any array of photo detectors, linear or 2D, has finite number of pixels. Therefore, (a) the maximum achievable resolution is RANGE / NUMBER-OF-PIXELS, or (b) the maximum range is
REQUIRED-RESOULUTION * NUMBER-OF-PIXELS. Attempts to defeat this trade-off with more complex analysis software techniques like "pixel interpolation" are somewhat successful and must be used with care due to the fact that mathematical procedures, while improving on resolution, may cause undesired side effects like shape distortion, Moiré noise, etc.
2. Optical aberrations: if the lens used does not "picture" the image precisely, it is impossible to conduct quality measurements no matter how good the camera and image analysis software are. This explains the price gap between the consumer lenses and the gauging lenses.
3. Lighting: it is critical and not any less important than quality of optics and electronics. Lighting must correspond to the type of optic used whether it is
telecentric, bright field, dark field, etc. Without proper illumination, in the case of defect or pattern recognition, the camera becomes less sensitive or even blind to what it supposed to watch for. In dimensional measurements, unevenness in illumination can cause dimensional distortions.
4. Timing: it takes time to (a) take a frame, (b) bring the image into a software-accessible memory, and (c) analyze the image. Most of the current frame grabbers combine (a) and (b). The use of high-speed cameras reduces the time to acquire an image, but there is a trade-off of the low resolution (typically, 640x480 pixels). In the case when multiple cameras are used, the situation gets more complex - often cameras must be synchronized in order not to have "gaps" in inspection processes. Image analysis can be sped up by optimizing software routines and reducing their amount to only what is absolutely necessary. |
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Lightway Systems Corp., 59
Wellandvale Road, St. Catharines, ON Canada L2S 3Y2
Voice/Fax: 905-688-7102 Email: info@lightwaysystems.com |
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